Title :
Automated test and tuning system for microwave filters
Author :
Harscher, P. ; Vahldieck, R. ; Amari, S.
Author_Institution :
Swiss Fed. Inst. of Technol., Zurich, Switzerland
Abstract :
A novel method for computerized diagnosis and automatic tuning of microwave (cavity) filters is introduced. The method is based on equivalent network theory using modified filter synthesis equations, including all characteristic filter parameters like resonant frequency, losses of individual resonators, input-/output couplings and couplings between resonators. Instead of using field simulators to extract filter parameters and associated network sensitivities, a more practical and more accurate parameter extraction process of measured S-parameter data is utilized. Thus automatic tuning becomes a two step process. In the first step the exact parameter values of an untuned filter as well as parameter sensitivities are extracted from a series of S-parameter measurements. In a second step gradient optimization is used on the so corrected model to find the tuning screw positions to give the same parameter set as obtained from the synthesis.
Keywords :
S-parameters; automatic testing; cavity resonator filters; circuit testing; circuit tuning; equivalent circuits; gradient methods; microwave filters; microwave measurement; S-parameters; automatic testing; automatic tuning; cavity resonator; computerized diagnosis; equivalent network; filter synthesis; gradient optimization; microwave filter; parameter extraction; Automatic testing; Data mining; Filtering theory; Microwave filters; Microwave theory and techniques; Network synthesis; Resonator filters; Scattering parameters; System testing; Tuning;
Conference_Titel :
Microwave Symposium Digest, 2001 IEEE MTT-S International
Conference_Location :
Phoenix, AZ, USA
Print_ISBN :
0-7803-6538-0
DOI :
10.1109/MWSYM.2001.967197