Title :
Small-footprint Integrated Bragg Gratings in SOI spiral waveguides
Author :
Simard, A.D. ; Painchaud, Y. ; LaRochelle, Sophie
Author_Institution :
Centre d´Opt., Photonique et Laser, Univ. Laval, Quebec City, QC, Canada
Abstract :
Integrated optical filters with flexible and precisely tailored spectral responses are required for many applications in communication and sensing. Integrated Bragg gratings (IBG) in silicon-on-insulator (SOI) waveguides can provide these filtering characteristics on a low-cost platform but a major drawback is the need for long grating structures to obtain elaborate spectral responses, which can pose problem when small footprints are desired. A mean to overcome this problem is to fabricate IBGs in spiral-waveguides (Fig. 1-a)). As a result, the footprint of the device is drastically reduced. However, the curvature modifies the waveguide effective index and distorts the grating spectrum. In this work, we design and fabricate IBGs in spiral waveguides using 193 nm deep UV photolithography and successfully avoid this distortion by adding a phase term, Ω(z), to compensate the effective index perturbation, δn(R(z)), caused by the curvature profile, R(z).
Keywords :
Bragg gratings; compensation; integrated optics; optical design techniques; optical distortion; optical fabrication; optical waveguide filters; optical waveguides; silicon-on-insulator; ultraviolet lithography; SOI spiral waveguides; Si; UV photolithography; compensation; curvature profile; effective index perturbation; grating spectrum; integrated optical filters; optical design; optical distortion; optical fabrication; silicon-on-insulator waveguides; small-footprint integrated Bragg gratings; waveguide effective index; wavelength 193 nm; Bragg gratings; Gratings; Indexes; Optical distortion; Optical filters; Optical waveguides; Spirals;
Conference_Titel :
Lasers and Electro-Optics Europe (CLEO EUROPE/IQEC), 2013 Conference on and International Quantum Electronics Conference
Conference_Location :
Munich
Print_ISBN :
978-1-4799-0593-5
DOI :
10.1109/CLEOE-IQEC.2013.6801417