DocumentCode :
1927528
Title :
An azimuthally polarized light source for the optical near field
Author :
Ploss, Daniel ; Kriesch, Arian ; Pfeifer, H. ; Banzer, Peter ; Peschel, Ulf
Author_Institution :
Inst. of Opt., Univ. of Erlangen-Nuremberg, Erlangen, Germany
fYear :
2013
fDate :
12-16 May 2013
Firstpage :
1
Lastpage :
1
Abstract :
In near field scanning optical microscopy (NSOM) a sharp tip with a defined aperture allows for direct scanning and subwavelength imaging of samples that otherwise cannot be excited from the far field. To control the interaction between tip and sample ideally a specifically prepared polarization state of light is desirable [1-3]. By coupling a Gaussian beam with an optimized elliptical polarization into a single mode optical fiber, which tapers down to a well-chosen μm scale diameter and undergoes a 60 degrees bend, we can reproducibly prepare an azimuthal polarization state at the tip aperture.
Keywords :
near-field scanning optical microscopy; optical fibre polarisation; Gaussian beam; NSOM; azimuthal polarization state; azimuthally polarized light source; direct scanning; elliptical polarization; near field scanning optical microscopy; optical near field; single mode optical fiber; subwavelength imaging; tip aperture; Apertures; Optical fiber polarization; Optical imaging; Optical polarization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Europe (CLEO EUROPE/IQEC), 2013 Conference on and International Quantum Electronics Conference
Conference_Location :
Munich
Print_ISBN :
978-1-4799-0593-5
Type :
conf
DOI :
10.1109/CLEOE-IQEC.2013.6801426
Filename :
6801426
Link To Document :
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