Title :
Adaptive simulation sampling using an Autoregressive framework
Author :
Daruwalla, Sharookh ; Sendag, Resit ; Yi, Joshua
Author_Institution :
Dept. of Comput. Sci., Portland State Univ., Portland, OR, USA
Abstract :
Software simulators remain several orders of magnitude slower than the modern microprocessor architectures they simulate. Although various reduced-time simulation tools are available to accurately help pick truncated benchmark simulation, they either come with a need for offline analysis of the benchmarks initially or require many iterative runs of the benchmark. In this paper, we present a novel sampling simulation method, which only requires a single run of the benchmark to achieve a desired confidence interval, with no offline analysis and gives comparable results in accuracy and sample sizes to current simulation methodologies. Our method is a novel configuration independent approach that incorporates an Autoregressive (AR) model using the squared coefficient of variance (SCV) of Cycles per Instruction (CPI). Using the sampled SCVs of past intervals of a benchmark, the model computes the required number of samples for the next interval through a derived relationship between number of samples and the SCVs of the CPI distribution. Our implementation of the AR model achieves an actual average error of only 0.76% on CPI with a 99.7% confidence interval of plusmn0.3% for all SPEC2K benchmarks while simulating, in detail, an average of 40 million instructions per benchmark.
Keywords :
autoregressive processes; digital simulation; adaptive simulation sampling; autoregressive framework; autoregressive model; benchmark simulation; configuration independent approach; cycles per instruction; microprocessor architecture; offline analysis; reduced-time simulation tool; sampling simulation method; software simulator; squared coefficient of variance; Analytical models; Computational modeling; Computer architecture; Computer networks; Computer science; Computer simulation; Distributed computing; Microprocessors; Sampling methods; Silicon;
Conference_Titel :
Systems, Architectures, Modeling, and Simulation, 2009. SAMOS '09. International Symposium on
Conference_Location :
Samos
Print_ISBN :
978-1-4244-4502-8
DOI :
10.1109/ICSAMOS.2009.5289242