• DocumentCode
    1927982
  • Title

    Cluster counting for E799/E832 at Fermilab

  • Author

    Haney, M.J. ; Gollin, G.D. ; Yamanaka, T.

  • Author_Institution
    Illinois Univ., Urbana, IL, USA
  • fYear
    1992
  • fDate
    25-31 Oct 1992
  • Firstpage
    338
  • Abstract
    A high-speed algorithm for counting the number of geographically contiguous above-threshold hits (clusters) in a CsI array is presented. The algorithm processes an N*N array in O(N) time, using O(N) parallel logic elements with only four inputs each. For the 40×40 (equivalent) array in the E799/E832 experiments at Fermilab, this cluster count information will be made available to the Level 2 trigger in less than 2 μs. This approach is based on simple pattern recognition of local concavity and convexity in the signals from adjacent blocks in the CsI array. This approach is a two-dimensional analog to the Huffman-Clowes edge-labeling scheme developed for artificial intelligence and scene interpretation. The status of the implementation of this algorithm using Xilinx XC3042 field programmable gate arrays is presented
  • Keywords
    caesium compounds; logic arrays; pattern recognition; physics computing; scintillation counters; trigger circuits; CsI array; E799/E832 experiments; Fermilab; Huffman-Clowes edge-labeling scheme; Level 2 trigger; O(N) parallel logic elements; Xilinx XC3042 field programmable gate arrays; artificial intelligence; cluster count information; convexity; geographically contiguous above-threshold hits; high-speed algorithm; local concavity; pattern recognition; scene interpretation; scintillation counter; two-dimensional analog; Artificial intelligence; Clustering algorithms; Field programmable analog arrays; Field programmable gate arrays; Labeling; Layout; Logic arrays; Pattern matching; Pattern recognition; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference, 1992., Conference Record of the 1992 IEEE
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-0884-0
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1992.301247
  • Filename
    301247