Title : 
Cluster counting for E799/E832 at Fermilab
         
        
            Author : 
Haney, M.J. ; Gollin, G.D. ; Yamanaka, T.
         
        
            Author_Institution : 
Illinois Univ., Urbana, IL, USA
         
        
        
        
        
            Abstract : 
A high-speed algorithm for counting the number of geographically contiguous above-threshold hits (clusters) in a CsI array is presented. The algorithm processes an N*N array in O(N) time, using O(N) parallel logic elements with only four inputs each. For the 40×40 (equivalent) array in the E799/E832 experiments at Fermilab, this cluster count information will be made available to the Level 2 trigger in less than 2 μs. This approach is based on simple pattern recognition of local concavity and convexity in the signals from adjacent blocks in the CsI array. This approach is a two-dimensional analog to the Huffman-Clowes edge-labeling scheme developed for artificial intelligence and scene interpretation. The status of the implementation of this algorithm using Xilinx XC3042 field programmable gate arrays is presented
         
        
            Keywords : 
caesium compounds; logic arrays; pattern recognition; physics computing; scintillation counters; trigger circuits; CsI array; E799/E832 experiments; Fermilab; Huffman-Clowes edge-labeling scheme; Level 2 trigger; O(N) parallel logic elements; Xilinx XC3042 field programmable gate arrays; artificial intelligence; cluster count information; convexity; geographically contiguous above-threshold hits; high-speed algorithm; local concavity; pattern recognition; scene interpretation; scintillation counter; two-dimensional analog; Artificial intelligence; Clustering algorithms; Field programmable analog arrays; Field programmable gate arrays; Labeling; Layout; Logic arrays; Pattern matching; Pattern recognition; Semiconductor device measurement;
         
        
        
        
            Conference_Titel : 
Nuclear Science Symposium and Medical Imaging Conference, 1992., Conference Record of the 1992 IEEE
         
        
            Conference_Location : 
Orlando, FL
         
        
            Print_ISBN : 
0-7803-0884-0
         
        
        
            DOI : 
10.1109/NSSMIC.1992.301247