DocumentCode
1928017
Title
Characterization of 15 kV SiC n-IGBT and its application considerations for high power converters
Author
Kadavelugu, Arun ; Bhattacharya, Surya ; Sei-Hyung Ryu ; Van Brunt, E. ; Grider, David ; Agarwal, Abhishek ; Leslie, Scott
Author_Institution
FREEDM Syst. Center, North Carolina State Univ., Raleigh, NC, USA
fYear
2013
fDate
15-19 Sept. 2013
Firstpage
2528
Lastpage
2535
Abstract
The 4H-SiC n-IGBT is a promising power semiconductor device for medium voltage power conversion. Currently, Cree has successfully built 15 kV n-IGBTs. These IGBTs are pivotal for the smart grid power conversion systems and medium voltage drives. The need for complex multi-level topologies or series connected devices can be eliminated, while achieving reduced power loss, by using the SiC IGBT. In this paper, characteristics of the 15 kV n-IGBT have been reported for the first time. The turn-on and turn-off transitions of the 15 kV, 20 A IGBT have been experimentally evaluated up to 11 kV. This is highest switching characterization voltage ever reported on a single power semiconductor device. The paper includes static characteristics up to 25 A (forward) and 12 kV (blocking). The dependency of the power loss with voltage, current and temperature are provided. In addition, the basic converter design considerations using this ultrahigh voltage IGBT for high power conversion applications are presented. Also, a comparative evaluation is reported with an IGBT with thicker field-stop buffer layer as a means to show flexibility in choosing the IGBT design parameters based on the power converter frequency and power rating specification. Finally, power loss comparison of the IGBTs and MOSFET is provided to consummate the results for a complete reference.
Keywords
buffer layers; insulated gate bipolar transistors; power convertors; silicon compounds; wide band gap semiconductors; 4H-SiC n-IGBT; Cree; SiC; current 20 A; field-stop buffer layer; medium voltage drives; medium voltage power conversion; power converter frequency; power loss; power rating specification; power semiconductor device; smart grid power conversion systems; turn-off transitions; turn-on transitions; voltage 15 kV; Buffer layers; Capacitance; Insulated gate bipolar transistors; Logic gates; Power conversion; Resistance; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Energy Conversion Congress and Exposition (ECCE), 2013 IEEE
Conference_Location
Denver, CO
Type
conf
DOI
10.1109/ECCE.2013.6647027
Filename
6647027
Link To Document