Accelerated test for cobalt migration in thin-film rigid disk

Author

Lin, Moon Sun ; Changdar Tsai ; Sun, YaChun ; Huang, Ward ; Wang, C.M. ; Dong, Chsrles

Author_Institution

Trace Storage Technology Co.

fYear

1999

fDate

18-21 May 1999

Keywords

Cobalt; Life estimation; Testing; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International

Conference_Location

Kyongju, Korea

Print_ISBN

0-7803-5555-5

Type

DOI

10.1109/INTMAG.1999.837514

Filename

837514

Link To Document