DocumentCode
1928614
Title
Experimental error rate in longitudinal thin film media
Author
Malhotra, Sudhir ; Lal, Brij B. ; Schultz, Marilee ; Sordello, Cks ; Kimmal, Jay ; Russak, Michael
Author_Institution
HMT Technology
fYear
1999
fDate
18-21 May 1999
Keywords
Bit error rate; Error analysis; Low-frequency noise; Magnetic films; Magnetic noise; Magnetic properties; Magnetic recording; Saturation magnetization; Signal to noise ratio; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location
Kyongju, Korea
Print_ISBN
0-7803-5555-5
Type
conf
DOI
10.1109/INTMAG.1999.837535
Filename
837535
Link To Document