• DocumentCode
    1928628
  • Title

    A combo Analog-to-Digital/Analog-to-Multiple-Value converter with configurable resolution

  • Author

    Petrellis, Nikos ; Birbas, Michael ; Kikidis, John ; Birbas, Alex

  • Author_Institution
    Analogies S.A., Platani-Rio, Greece
  • fYear
    2009
  • fDate
    9-10 Sept. 2009
  • Firstpage
    203
  • Lastpage
    206
  • Abstract
    An analog-to-digital converter (ADC) with a configurable 4, 8 or 12-bit resolution is presented in this paper. It is based on a binary tree structure implemented with current-mode circuits whereas an appropriate integer division is performed at the nodes of the tree. The binary representation of the analog input value is produced at the leaves of the tree while its corresponding multi-value representation can be directly retrieved from the intermediate nodes of the tree thus avoiding additional encoding of the binary representation or expensive process technologies and specialized devices that are required by other approaches. The sampling speed of the 12-bit ADC is 140 MS/s and requires only 0.123 mm2 of die area in 90 nm CMOS technology while the 6-digit Analog-to-Quaternary Conversion (AQC) achieves 155 MS/s rate.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; current-mode circuits; network topology; CMOS technology; analog-to-multiple-value converter; analog-to-quaternary conversion; binary tree structure; combo analog-to-digital converter; configurable resolution; current-mode circuits; size 90 nm; Amplitude modulation; Analog-digital conversion; Binary trees; CMOS process; CMOS technology; Current mode circuits; Encoding; Energy consumption; Protocols; Signal sampling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Electronics, 2009. AE 2009
  • Conference_Location
    Pilsen
  • ISSN
    1803-7232
  • Print_ISBN
    978-80-7043-781-0
  • Type

    conf

  • Filename
    5289279