Title :
MR behavior in tunneling junctions with a nonmagnetic metal layer between barrier and electrode
Author :
Yamanaka, H. ; Saito, K. ; Takanashi, K. ; Fujimori, H.
Author_Institution :
Read-Rite SMI Co.
Keywords :
Artificial intelligence; Electrodes; Insulation; Ion beams; Iron; Temperature dependence; Temperature measurement; Tunneling; Voltage;
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
DOI :
10.1109/INTMAG.1999.837543
