MR behavior in tunneling junctions with a nonmagnetic metal layer between barrier and electrode

Author

Yamanaka, H. ; Saito, K. ; Takanashi, K. ; Fujimori, H.

Author_Institution

Read-Rite SMI Co.

fYear

1999

fDate

18-21 May 1999

Keywords

Artificial intelligence; Electrodes; Insulation; Ion beams; Iron; Temperature dependence; Temperature measurement; Tunneling; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International

Conference_Location

Kyongju, Korea

Print_ISBN

0-7803-5555-5

Type

DOI

10.1109/INTMAG.1999.837543

Filename

837543

Link To Document