DocumentCode :
1928965
Title :
Development of read-out circuit and level 2 buffering for multi-channel time measurement chip
Author :
Ekenberg, T. ; Van Berg, R. ; Williams, H.H.
Author_Institution :
Pennsylvania Univ., Philadelphia, PA, USA
fYear :
1992
fDate :
25-31 Oct 1992
Firstpage :
474
Abstract :
The authors describe the design and development of the read-out circuit and level two buffering for a multichannel time measurement chip, L21. The current design interfaces a four-channel version of the time measurement cell with the next level in the data acquisition chain, the data collection chip, for the read-out of the SDC (Solenoidal Detector Collaboration) straw tracking detector. The entire chip was implemented as a standard cell design, except for a full-custom dual-port embedded SRAM (static random-access memory). To verify the logical functionality of the design it was simulated using Verilog. Timing simulations were done with Hspice on blocks of up to 7000 transistors to verify the operation of certain critical high-speed interconnects. The chip was submitted for fabrication in a 1.2 μm n-well process and measured 12 mm2
Keywords :
buffer circuits; microprocessor chips; time measurement; Hspice; L21; SDC; SRAM; Verilog; level 2 buffering; multi-channel time measurement chip; read-out circuit; static random-access memory; straw tracking detector; Collaboration; Data acquisition; Detectors; Fabrication; Hardware design languages; Integrated circuit interconnections; Random access memory; Semiconductor device measurement; Time measurement; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1992., Conference Record of the 1992 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-0884-0
Type :
conf
DOI :
10.1109/NSSMIC.1992.301297
Filename :
301297
Link To Document :
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