Title :
Effect of slot edge defects on the head/tape spacing
Author :
Garrettson, B. ; Tan, Sanw ; Lakshmikumaran, A. Mnd ; Talke, FrankE
Author_Institution :
University of California
Keywords :
Calibration; Fabrication; Glass; Lapping; Magnetic heads; Pattern analysis; Production; Semiconductor device measurement; Testing; Tribology;
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
DOI :
10.1109/INTMAG.1999.837588
