DocumentCode
1929779
Title
Thermal Re-Emission of Trapped Hot Electrons in NMOS Transistors
Author
Or, S. S Burnette ; Forbes, Leonard ; Haddad, H.
Author_Institution
Dept. of Elect. & Comp. Engr., Oregon State University
fYear
1991
fDate
17-19 June 1991
Keywords
Electron devices; Electron traps; Hot carrier effects; Hot carriers; MOSFETs; Predictive models; Secondary generated hot electron injection; Thermal degradation; Thermal stresses; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 1991. 49th Annual
Conference_Location
Boulder, CO, USA
Print_ISBN
0-87942-647-0
Type
conf
DOI
10.1109/DRC.1991.664711
Filename
664711
Link To Document