• DocumentCode
    1929927
  • Title

    The minor hysteresis loop under rotating magnetic fields in machine laminations

  • Author

    Alatawneh, Natheer ; Pillay, Pragasen

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, QC, Canada
  • fYear
    2013
  • fDate
    15-19 Sept. 2013
  • Firstpage
    3172
  • Lastpage
    3179
  • Abstract
    In rotating AC machines, the saturated flux density waveforms contain harmonics, which create minor hysteresis loops. The minor hysteresis loop in machine laminations causes a serious challenge in core loss estimation, especially under rotating magnetic fields. This paper highlights the problem of harmonics in rotating field and its effect on the core loss estimation. In addition, the behavior of minor loops under rotating fields is compared with the minor loops under pulsating fields. Measurements were carried out on a non oriented silicon steel sample of M36G29 with different fundamental frequencies of interest to the industry, 60 Hz and 400 Hz, with consideration of the third harmonic at each frequency. A novel design of magnetizing test fixture based on an electromagnetic Halbach array is used to perform these measurements. Results are presented and discussed.
  • Keywords
    electric machines; elemental semiconductors; laminations; machine insulation; magnetic hysteresis; silicon; steel; M36G29; core loss estimation; electromagnetic Halbach array; frequency 400 Hz; frequency 60 Hz; machine laminations; minor hysteresis loop; minor hysteresis loops; nonoriented steel sample; pulsating fields; rotating AC machines; rotating magnetic fields; saturated flux density waveforms; test fixture magnetization; Arrays; Core loss; Harmonic analysis; Hysteresis; Magnetic field measurement; Magnetic fields; Magnetic hysteresis; Electrical steel; Halbach array; Madelung´s Rules; Magnetic Minor Hysteresis loop; Rotational core loss;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition (ECCE), 2013 IEEE
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/ECCE.2013.6647116
  • Filename
    6647116