Application of configurable integrated test for MMIC production control

A configurable integrated test (CIT) model has been developed for GaAs MMIC (monolithic microwave integrated circuit) production control. The optimal process/test strategy for a MMIC in the production phase can be easily predicted from this model. For early detection of the unqualified wafers or chips, the adaptive nature of the CIT model also suggests suitability of the screen criteria and the necessity of each test step. These advantages result in cost reduction for MMIC manufacturing. The CIT theory and application examples are presented.<>