Application of configurable integrated test for MMIC production control

Author

Wang, H. ; Yang, D. ; Esfandiari, R. ; Joseph, T. ; Ng, G.

Author_Institution

TRW/ESG/ETD, Redondo Beach, CA, USA

fYear

1989

fDate

22-25 Oct. 1989

Firstpage

227

Lastpage

230

Abstract

A configurable integrated test (CIT) model has been developed for GaAs MMIC (monolithic microwave integrated circuit) production control. The optimal process/test strategy for a MMIC in the production phase can be easily predicted from this model. For early detection of the unqualified wafers or chips, the adaptive nature of the CIT model also suggests suitability of the screen criteria and the necessity of each test step. These advantages result in cost reduction for MMIC manufacturing. The CIT theory and application examples are presented.<>

Keywords

MMIC; integrated circuit manufacture; integrated circuit testing; production control; production testing; GaAs; MMIC manufacturing; MMIC production control; configurable integrated test; cost reduction; model; monolithic microwave integrated circuit; optimal process/test strategy; screen criteria; unqualified chips; unqualified wafers; Circuit testing; Gallium arsenide; Integrated circuit modeling; Integrated circuit testing; MMICs; Microwave integrated circuits; Monolithic integrated circuits; Predictive models; Production control; Semiconductor device modeling;

fLanguage

English

Publisher

ieee

Conference_Titel

Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1989. Technical Digest 1989., 11th Annual

Conference_Location

San Diego, CA, USA

Type

conf

DOI

10.1109/GAAS.1989.69332

Filename

69332