DocumentCode
1930019
Title
Delocalization of focused intense ultra-short laser pulses in air and transparent solids
Author
Konov, V.I. ; Kononenko, V.V. ; Klimentov, S.M. ; Pivovarov, P.A.
Author_Institution
Gen. Phys. Inst., Moscow, Russia
fYear
2013
fDate
12-16 May 2013
Firstpage
1
Lastpage
1
Abstract
Ti:Al2O3 lasers emitting pulses with duration τ = 100-140 fs at basic wavelength λ = 800 nm were used in most of the experiments. Gaussian laser beams were focused either in atmospheric air (helium, argon) or inside the bulk of silicon or diamond samples with approximately equal spot radius rb ≈10-15um. In the case of silicon target by means of OPA λ was shifted to 1200 nm. Measurements of scattered light were performed calorimetrically. Variation of medium refractive index (Δn) was controlled by pump-probe setup combined with sensitive interferometer.
Keywords
alumina; diamond; high-speed optical techniques; laser beams; light interferometry; light scattering; optical focusing; optical parametric amplifiers; refractive index; silicon; solid lasers; titanium; titanium compounds; Al2O3:Ti; C; Gaussian laser beams; OPA; Si; Ti:Al2O3 lasers; atmospheric air; diamond samples; focused intense ultra-short laser pulse delocalization; medium refractive index; pump-probe set-up; scattered light; sensitive interferometer; silicon bulk; time 100 fs to 140 fs; transparent solids; wavelength 800 nm; Gas lasers; Laser beams; Measurement by laser beam; Particle beams; Plasmas; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Europe (CLEO EUROPE/IQEC), 2013 Conference on and International Quantum Electronics Conference
Conference_Location
Munich
Print_ISBN
978-1-4799-0593-5
Type
conf
DOI
10.1109/CLEOE-IQEC.2013.6801543
Filename
6801543
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