DocumentCode
1930386
Title
An unconditionally stable finite element time domain solution of active nonlinear microwave circuits using perfectly matched layers
Author
Hsiao-Ping Tsai ; Yuanxun Wang ; Tatsuo Itoh
Author_Institution
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Volume
3
fYear
2001
fDate
20-24 May 2001
Firstpage
2059
Abstract
This paper proposes an extension of the unconditionally stable finite element time domain (FETD) method for the global electromagnetic analysis of active microwave circuits. This formulation has two advantages. First, the time step size is no longer governed by the spatial discretization of the mesh, but rather by the Nyquist sampling criterion. Second, the implementation of the truncation by the perfectly matched layers is straightforward. A benchmark test on a microwave amplifier indicates that this extended FETD algorithm is not only superior than FDTD-based algorithm in mesh flexibility and simulation accuracy, but also reduces computation time dramatically.
Keywords
active networks; circuit simulation; finite element analysis; microwave amplifiers; microwave circuits; nonlinear network analysis; numerical stability; time-domain analysis; Nyquist sampling; active nonlinear microwave circuit; computation time; finite element time domain algorithm; global electromagnetic analysis; microwave amplifier; numerical simulation; perfectly matched layer; spatial discretization; unconditional stability; Benchmark testing; Circuit testing; Electromagnetic analysis; Finite element methods; Microwave amplifiers; Microwave circuits; Microwave theory and techniques; Perfectly matched layers; Sampling methods; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2001 IEEE MTT-S International
Conference_Location
Phoenix, AZ, USA
ISSN
0149-645X
Print_ISBN
0-7803-6538-0
Type
conf
DOI
10.1109/MWSYM.2001.967317
Filename
967317
Link To Document