Nonlinear statistical modeling of large-signal device behavior

Author

Stiebler, W. ; Rose, F. ; Selin, J.

Author_Institution

Raytheon RF Components, Andover, MA, USA

Volume

3

fYear

2001

fDate

20-24 May 2001

Firstpage

2071

Abstract

A novel technique for modeling the nonlinear statistics of large- and small-signal device model parameters is proposed. It features transformation of individual random variables and introduces a new criterion for optimum statistical variable transformation based on Quantile-Quantile plots. Subsequently, multivariant methods are applied to build an inherently nonlinear statistical model. The models are easily implemented into current CAD tools and are suited to accurately predict yield in the presence of process variations and process shifts. Results for devices and MMIC circuits operated under small- and large signal excitation validate the accuracy of the method.

Keywords

MMIC; integrated circuit modelling; integrated circuit yield; CAD tool; MMIC circuit; device parameters; large-signal characteristics; multivariant method; nonlinear statistical model; quantile-quantile plot; random variable transformation; small-signal characteristics; yield optimization; Circuits; Condition monitoring; Electrical resistance measurement; MMICs; Measurement standards; Parameter estimation; Parametric statistics; Process control; Radio frequency; Random variables;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 2001 IEEE MTT-S International

Conference_Location

Phoenix, AZ, USA

ISSN

0149-645X

Print_ISBN

0-7803-6538-0

Type

conf

DOI

10.1109/MWSYM.2001.967320

Filename

967320