• DocumentCode
    1930904
  • Title

    Transformation of min-max optimization to least-square estimation and application to interconnect design optimization

  • Author

    Wang, Jimmy Shinn-Hwa ; Dai, Wayne Wei-Ming

  • Author_Institution
    Comput. Eng. Board of Studies, California Univ., Santa Cruz, CA, USA
  • fYear
    1995
  • fDate
    2-4 Oct 1995
  • Firstpage
    664
  • Lastpage
    670
  • Abstract
    This paper describes a new approach to find a tighter bound of the transformation of the min-max problems into the one of least-square estimation. It is well known that the above transformation of one problem to the other can lead to the proof that their target functions linearly bound each other. However, this linear bound is not a tight one. In this paper, we prove that if we transform the min-max problem into two least-square estimation problems, where one minimizes the root-mean-square (RMS) of the original function and the other one minimizes the RMS of the difference between the original function and an arbitrary constant, one can obtain a tighter bound between their target functions. The tighter bound given by this new approach depends on the outcome of the second least-square estimation problem, so there is a great incentive to choose the arbitrary constant which gives the smallest RMS of the second least-square estimation problem. For a problem with a large number of variables, this new tighter bound can be two to three order tighter than the old one
  • Keywords
    circuit layout CAD; least squares approximations; minimax techniques; minimisation; multichip modules; interconnect design optimization; least-square estimation; min-max optimization transformation; multichip modules; tighter bound; Application software; Design automation; Design engineering; Design optimization; Least squares approximation; Optimization methods; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 1995. ICCD '95. Proceedings., 1995 IEEE International Conference on
  • Conference_Location
    Austin, TX
  • ISSN
    1063-6404
  • Print_ISBN
    0-8186-7165-3
  • Type

    conf

  • DOI
    10.1109/ICCD.1995.528939
  • Filename
    528939