DocumentCode :
1931191
Title :
Gold Ball Shear Stress Analysis on Different Surface Morphology
Author :
Retnasamy, Vithyacharan ; Sauli, Zaliman ; Rahman, Norazeani A. ; Hatta, R.M. ; Vairavan, Rajendaran ; Norhaimi, Wan M W
Author_Institution :
Sch. of Microelectron. Eng., Univ. Malaysia Perlis (UniMAP), Pauh Putra Perlis, Malaysia
fYear :
2012
fDate :
25-27 Sept. 2012
Firstpage :
168
Lastpage :
171
Abstract :
As the trend of integrated circuit is lashing towards miniaturized facet, wire bonding interconnection is still vastly being utilized in the first level of electronic packaging. The bond strength of the bonded wires is scrutinized by wire bond shear test. Hence in this paper, the effects of bond pad surface on the stress response of gold ball bond during wire bond shear test were investigated through simulation. Three types of bond pad surface, flat surface, hemisphere surface and sharp groove surface are utilized for comparison purpose in this study. Ansys version 11 was used for the simulation. The simulation results showed that the gold ball bond on sharp groove surface bond pad obtained the highest stress response. The maximum stress responses for all three types of bond pad surface were obtained at the shear ram displacement distance of 35μm.
Keywords :
gold; integrated circuit packaging; lead bonding; surface morphology; Ansys version 11; Au; bond pad surface; flat surface; gold ball bond; gold ball shear stress analysis; hemisphere surface; sharp groove surface bond pad; shear ram displacement distance; stress response; surface morphology; wire bond shear test; Bonding; Finite element methods; Gold; Random access memory; Solid modeling; Stress; Wires; Wire bond shear test;bond pad surface; gold wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Intelligence, Modelling and Simulation (CIMSiM), 2012 Fourth International Conference on
Conference_Location :
Kuantan
ISSN :
2166-8531
Print_ISBN :
978-1-4673-3113-5
Type :
conf
DOI :
10.1109/CIMSim.2012.88
Filename :
6338069
Link To Document :
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