Title :
Highly defined narrow track write heads fabricated by focused ion beam trimming with the Al/sub 2/O/sub 3/ refilling process
Author :
Ishi, Tsutomu ; Nonaka, Yoshihiro ; Ishiwata, Nobuyuki
Author_Institution :
NEC Corporation
Keywords :
Focusing; Ion beams; Magnetic force microscopy; Magnetic heads;
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
DOI :
10.1109/INTMAG.1999.837712
