Title :
Bias-voltage-controlled interlayer exchange coupling
Author :
You, Chun-Yeol ; Bader, S.D.
Author_Institution :
Argonne National Laboratory
Keywords :
Automotive materials; Control systems; Dielectric constant; Electrons; Insulation; Iron; Magnetic fields; Reflectivity; Tin; Voltage control;
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
DOI :
10.1109/INTMAG.1999.837728
