Title :
Wavelength dependence of optical characteristics for TbFeCo and MO disk structure for double-wavelength readout MO disk
Author :
Nakagawa, K. ; Itoh, A. ; Zhang, R.J. ; Zheng, Y.X. ; Chen, L.Y.
Author_Institution :
Nihon University
Keywords :
Educational institutions; Extinction coefficients; Optical films; Optical recording; Optical refraction; Optical variables control; Q measurement; Refractive index; Thickness measurement; Wavelength measurement;
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
DOI :
10.1109/INTMAG.1999.837732
