DocumentCode
1931843
Title
High-reliability semicondictor laser amplifiers
Author
Fisher, S J ; Skrimshire, C P ; Shaw, R N ; Farr, J R ; Spurdens, P.C. ; Wickes, H.J. ; Devlin, W.J.
Author_Institution
British Telecom Research Laboratories, Ipswich, England
fYear
1990
fDate
10-13 Sept. 1990
Firstpage
417
Lastpage
420
Abstract
This paper presents the first results of a preliminary study into the reliability of Semiconductor-Laser-Amplifiers (SLA´s). The results from ageing tests on semiconductor lasers which have one facet coated with a multilayer anti-reflection (AR) coating indicate that the AR coatings present no additional hazard. Preliminary data from devices having both facets AR coated (full amplifier structures) show minimal degradation in the main parameters. No degradation mechanisms, other than those occurring in standard buried heterostructure lasers, have been identified to date.
Keywords
Automatic testing; Coatings; Electronic equipment testing; Laser stability; Laser transitions; Life testing; Materials testing; Power lasers; Semiconductor device testing; Semiconductor optical amplifiers;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1990. ESSDERC '90. 20th European
Conference_Location
Nottingham, England
Print_ISBN
0750300655
Type
conf
Filename
5436329
Link To Document