• DocumentCode
    1931843
  • Title

    High-reliability semicondictor laser amplifiers

  • Author

    Fisher, S J ; Skrimshire, C P ; Shaw, R N ; Farr, J R ; Spurdens, P.C. ; Wickes, H.J. ; Devlin, W.J.

  • Author_Institution
    British Telecom Research Laboratories, Ipswich, England
  • fYear
    1990
  • fDate
    10-13 Sept. 1990
  • Firstpage
    417
  • Lastpage
    420
  • Abstract
    This paper presents the first results of a preliminary study into the reliability of Semiconductor-Laser-Amplifiers (SLA´s). The results from ageing tests on semiconductor lasers which have one facet coated with a multilayer anti-reflection (AR) coating indicate that the AR coatings present no additional hazard. Preliminary data from devices having both facets AR coated (full amplifier structures) show minimal degradation in the main parameters. No degradation mechanisms, other than those occurring in standard buried heterostructure lasers, have been identified to date.
  • Keywords
    Automatic testing; Coatings; Electronic equipment testing; Laser stability; Laser transitions; Life testing; Materials testing; Power lasers; Semiconductor device testing; Semiconductor optical amplifiers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1990. ESSDERC '90. 20th European
  • Conference_Location
    Nottingham, England
  • Print_ISBN
    0750300655
  • Type

    conf

  • Filename
    5436329