Title :
Data acquisition and interpretation of lifetime measurements
Author :
Coello, J. ; Pumar, S. ; Tobías, I. ; del Cafiizo, C. ; Luque, A.
Author_Institution :
Inst. de Energia Solar, Univ. Politecnica de Madrid, Spain
Abstract :
The objective of this work is to develop a software tool to improve the acquisition and treatment of data from lifetime measurements made by photoconductance techniques. Subsequently, an analytical expression for recombination is presented where surface recombination, Auger recombination and Shockley-Read-Hall recombination are included. This analytical expression is then fitted to the measured effective lifetime curve by nonlinear methods.
Keywords :
Auger effect; carrier lifetime; data acquisition; electric variables measurement; life testing; software tools; surface recombination; Auger recombination; Shockley-Read-Hall recombination; data acquisition; data interpretation; lifetime measurements; nonlinear methods; photoconductance techniques; software tool; surface recombination; Charge carrier lifetime; Coils; Data acquisition; Energy measurement; Laboratories; Lifetime estimation; Photoconductivity; Radiative recombination; Semiconductor materials; Silicon;
Conference_Titel :
Electron Devices, 2005 Spanish Conference on
Print_ISBN :
0-7803-8810-0
DOI :
10.1109/SCED.2005.1504372
