Title :
Heterojunction silicon solar cells obtained by hot-wire CVD at low temperature
Author :
Munoz, Delfina ; Voz, C. ; Martin, I. ; Orpella, A. ; Vetter, M. ; Puigdollers, J. ; Alcubilla, R. ; Fonrodona, M. ; Soler, D. ; Bertomeu, J. ; Andreu, J.
Author_Institution :
Departament d´´Enginyeria Electronica, Univ. Politecnica de Catalunya, Spain
Abstract :
In this work, first results on bifacial heterojunction solar cells incorporating thin silicon films by Hot-Wire CVD are presented. The heterojunction with intrinsic thin layer concept applied to the back contact avoids the high temperature anneal usually required for back surface field formation. Both p- and n-type crystalline silicon substrates have been considered. Contactless quasi-steady-state photoconductance measurements evidenced implicit open circuit voltages over 600 mV for heterojunction solar cells by HWCVD. Preliminary devices were fabricated with n-doped amorphous silicon emitter and p-doped microcrystalline silicon back contact. Intrinsic amorphous silicon buffer layers 5 nm thick were used in both sides. The maximum temperature in the whole fabrication process was 200 °C. The best solar cell yielded an active area conversion efficiency of 9.8% with an open circuit voltage of 577 mV, short circuit current of 26.1 mA·cm -2 and fill factor of 65%.
Keywords :
1/f noise; amorphous semiconductors; annealing; chemical vapour deposition; elemental semiconductors; passivation; semiconductor doping; semiconductor heterojunctions; silicon; solar cells; 200 C; 577 mV; amorphous silicon emitter; back surface field formation; bifacial heterojunction solar cells; heterojunction silicon solar cells; high temperature annealing; hot-wire CVD; microcrystalline silicon back contact; n-type crystalline silicon substrates; open circuit voltages; p-type crystalline silicon substrates; quasi-steady-state photoconductance measurements; thin silicon films; Amorphous silicon; Annealing; Circuits; Crystallization; Heterojunctions; Photoconducting devices; Photovoltaic cells; Semiconductor films; Temperature; Voltage;
Conference_Titel :
Electron Devices, 2005 Spanish Conference on
Conference_Location :
Tarragona
Print_ISBN :
0-7803-8810-0
DOI :
10.1109/SCED.2005.1504375