DocumentCode
1932253
Title
Comparison of magnetic images using point and thin-film magnetic force microscopy tips
Author
Liou, S.H.
Author_Institution
University of Nebraska
fYear
1999
fDate
18-21 May 1999
Keywords
Amorphous magnetic materials; Atomic force microscopy; Magnetic films; Magnetic force microscopy; Magnetic forces; Magnetic materials; Magnetization; Perpendicular magnetic recording; Sputtering; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location
Kyongju, Korea
Print_ISBN
0-7803-5555-5
Type
conf
DOI
10.1109/INTMAG.1999.837755
Filename
837755
Link To Document