Embedded test environment

This paper presents a way of accelerating the development of component test environments. After situating the field of application of circuits developed at the CNET, we present a solution that corresponds to a large extent to the functionalities of a test environment. Two aspects are considered in order to reduce the development cost of a test environment: firstly, it must be possible to program the test environment, and make it flexible for reuse in several circuits. Secondly, the test environment must be portable from the simulation tools to the high-performance validation tools such as accelerators or emulators