DocumentCode
1933039
Title
CULT: A unified framework for tracing and logging C-based designs
Author
Hong, Wei ; Viehl, Alexander ; Bannow, Nico ; Kerstan, Christian ; Post, Hendrik ; Bringmann, Oliver ; Rosenstiel, Wolfgang
Author_Institution
FZI Forschungszentrum Inf., Karlsruhe, Germany
fYear
2012
fDate
19-20 Sept. 2012
Firstpage
1
Lastpage
6
Abstract
This paper presents a novel framework for tracing and logging C-based designs of embedded hardware/software systems. The development of this C-based Unified Logging and Tracing (CULT) framework was driven by the necessity of a common development support environment between different design disciplines and at different early design phases in which development takes place using C-based languages (C/C++/SystemC). The elaborated framework is highly configurable and scalable. It requires only minimal code changes in order to be used and it implements enhanced features as a dynamic configurable history and backtracking of signals and values. Further, we demonstrate the interconnection with assertion-based verification (ABV) in order to support design testing and validation in early design phases. The framework will be released as open-source project for establishing a vital community and for building up a tooling landscape around the basic capabilities.
Keywords
C++ language; backtracking; embedded systems; hardware-software codesign; program diagnostics; program verification; public domain software; ABV; C++; C-based designs; C-based languages; C-based unified logging and tracing framework; CULT framework; SystemC; assertion-based verification; dynamic configurable history; embedded hardware-software systems; open-source project; signal backtracking; values backtracking; Adaptation models; Data models; Libraries; Sockets; Standards; Time domain analysis; Time varying systems; Logging; SystemC; SystemC AMS; SystemC TLM; Tracing;
fLanguage
English
Publisher
ieee
Conference_Titel
System, Software, SoC and Silicon Debug Conference (S4D), 2012
Conference_Location
Vienna
ISSN
2114-3684
Print_ISBN
978-1-4673-2454-0
Electronic_ISBN
2114-3684
Type
conf
Filename
6338157
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