Analog and mixed-signal testing by wavelet transformations of power supply current measurements

Author

Dimopoulos, Michael G. ; Spyronasios, Alexios D. ; Papakostas, Dimitris K. ; Konstantinou, Dimitrios K. ; Vassios, Basilios D. ; Hatzopoulo, Alkis A.

Author_Institution

Dept. of Electron., Alexander Tech. Educat. Inst. of Thessaloniki, Thessaloniki, Greece

fYear

2009

fDate

25-27 June 2009

Firstpage

505

Lastpage

508

Abstract

In this paper a test method based on wavelet transformation of the measured supply current (I_PS) waveforms is presented. The method is simple, offers a single-point test measurement solution and may easily be adapted to test various analog and mixed-signal systems. Experimental comparative results between the proposed method, a test method based on the RMS value of I_PS, and a test method utilizing the harmonic magnitude components of the I_PS spectrum are presented showing the effectiveness of the proposed testing scheme.

Keywords

electric current measurement; mixed analogue-digital integrated circuits; wavelet transforms; analog circuits; analog signal testing; mixed-signal testing; power supply current measurements; single-point test measurement solution; wavelet transformations; Circuit testing; Continuous wavelet transforms; Current measurement; Current supplies; Discrete wavelet transforms; Fourier transforms; Frequency; Power supplies; System testing; Wavelet transforms; Analog Circuits; Circuit Test; Mixed-Signal Test; Wavelet tranformations;

fLanguage

English

Publisher

ieee

Conference_Titel

Mixed Design of Integrated Circuits & Systems, 2009. MIXDES '09. MIXDES-16th International Conference

Conference_Location

Lodz

Print_ISBN

978-1-4244-4798-5

Electronic_ISBN

978-83-928756-1-1

Type

conf

Filename

5289490