Title :
Analog and mixed-signal testing by wavelet transformations of power supply current measurements
Author :
Dimopoulos, Michael G. ; Spyronasios, Alexios D. ; Papakostas, Dimitris K. ; Konstantinou, Dimitrios K. ; Vassios, Basilios D. ; Hatzopoulo, Alkis A.
Author_Institution :
Dept. of Electron., Alexander Tech. Educat. Inst. of Thessaloniki, Thessaloniki, Greece
Abstract :
In this paper a test method based on wavelet transformation of the measured supply current (IPS) waveforms is presented. The method is simple, offers a single-point test measurement solution and may easily be adapted to test various analog and mixed-signal systems. Experimental comparative results between the proposed method, a test method based on the RMS value of IPS, and a test method utilizing the harmonic magnitude components of the IPS spectrum are presented showing the effectiveness of the proposed testing scheme.
Keywords :
electric current measurement; mixed analogue-digital integrated circuits; wavelet transforms; analog circuits; analog signal testing; mixed-signal testing; power supply current measurements; single-point test measurement solution; wavelet transformations; Circuit testing; Continuous wavelet transforms; Current measurement; Current supplies; Discrete wavelet transforms; Fourier transforms; Frequency; Power supplies; System testing; Wavelet transforms; Analog Circuits; Circuit Test; Mixed-Signal Test; Wavelet tranformations;
Conference_Titel :
Mixed Design of Integrated Circuits & Systems, 2009. MIXDES '09. MIXDES-16th International Conference
Conference_Location :
Lodz
Print_ISBN :
978-1-4244-4798-5
Electronic_ISBN :
978-83-928756-1-1
