Title :
NMOS current mirror thermal analysis
Author :
Michalowski, Marek ; Jankowski, Mariusz ; De Mey, Gilbert
Author_Institution :
Dept. of Microelectron. & Comput. Sci., Tech. Univ. of Lodz, Lodz, Poland
Abstract :
The aim of this report is to investigate the influence of changing the ambient temperature on behavior of simple and cascode current mirror. Moreover we´ll investigate the influence of changing the temperature of each of the transistors separately with different temperature gradient configurations.
Keywords :
MOSFET; current mirrors; thermal analysis; NMOS current mirror; cascode current mirror; simple current mirror; temperature gradient configurations; thermal analysis; Circuit testing; Computer science; Current measurement; MOS devices; MOSFETs; Microelectronics; Mirrors; Temperature; Voltage measurement; Current Mirror; NMOS; Thermal Analysis;
Conference_Titel :
Mixed Design of Integrated Circuits & Systems, 2009. MIXDES '09. MIXDES-16th International Conference
Conference_Location :
Lodz
Print_ISBN :
978-1-4244-4798-5
Electronic_ISBN :
978-83-928756-1-1
