Title :
Sensing properties of tellurium based films to propylamine
Author :
Tsiulyanu, D. ; Marian, S. ; Miron, V. ; Liess, H.-D.
Author_Institution :
Dept. of Phys., Tech. Univ., Kishinau, Moldova
Abstract :
The effect of propylamine (C3H7NH2) on electrical conductivity of tellurium based thin films has been investigated. It is shown that the absorption of the propylamine vapor leads to reversible increase of resistance of the layer. The sensitivity as well as response and recovery times depends on the gas concentration. The structural characterization of the films and discussion are given
Keywords :
crystal structure; electrical conductivity; gas sensors; organic compounds; semiconductor materials; semiconductor thin films; tellurium compounds; C3H7NH2; absorption; electrical conductivity; gas concentration; propylamine; propylamine vapor; recovery times; resistance; response; sensing properties; structural characterization; tellurium based films; Absorption; Chemical sensors; Electric resistance; Physics; Pollution measurement; Scanning electron microscopy; Substrates; Surface morphology; Tellurium; X-ray diffraction;
Conference_Titel :
Semiconductor Conference, 2001. CAS 2001 Proceedings. International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-6666-2
DOI :
10.1109/SMICND.2001.967466
