DocumentCode :
1933724
Title :
Analysis of static and dynamic behaviour of SiC and Si devices connected in cascode configuration
Author :
Mihaila, A. ; Udrea, F. ; Azar, R. ; Brezeanu, G.
Author_Institution :
Dept. of Eng., Cambridge Univ., UK
Volume :
2
fYear :
2001
fDate :
37165
Firstpage :
333
Abstract :
This paper presents an analysis of the static and dynamic behaviour of a 1.2 kV SiC vertical JFET. The JFET can block voltages up to 1450 V (for VGS=80 V), with a specific on-resistance as low as 2.3 mΩcm2. The mixed-mode performance is investigated by coupling the SiC JFET in a cascode circuit with a low power Si MOSFET. Comparing the circuit performance to that of a SiC trench MOSFET, it turns out that the SiC/Si cascode is almost twice faster than the MOSFET. Coupling this with the fact that the SiC/Si cascode pair has better on-state performance, it is concluded that the cascode is a superior alternative to the classical SiC trench MOSFET
Keywords :
MOSFET; junction gate field effect transistors; power field effect transistors; power semiconductor switches; semiconductor device models; silicon compounds; wide band gap semiconductors; 1.2 kV; 1450 V; SiC vertical JFET/low power Si MOSFET; SiC-Si; blocking voltages; cascode configuration; circuit performance; dynamic behaviour; mixed-mode performance; numerical investigation; on-state performance; power switching applications; specific on-resistance; static behaviour; Avalanche breakdown; Circuit optimization; Coupling circuits; Dielectric materials; Dielectrics and electrical insulation; JFET circuits; MOSFET circuits; Power MOSFET; Silicon carbide; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference, 2001. CAS 2001 Proceedings. International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-6666-2
Type :
conf
DOI :
10.1109/SMICND.2001.967477
Filename :
967477
Link To Document :
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