• DocumentCode
    1933961
  • Title

    Series resistance effects on EPROM programming

  • Author

    Bez, R. ; Cantarelli, D. ; Cappelletti, P. ; Maurelli, A. ; Ravazzi, L.

  • Author_Institution
    SGS-Thomson Microelectronics, 20041 Agrate MI, Italy
  • fYear
    1990
  • fDate
    10-13 Sept. 1990
  • Firstpage
    165
  • Lastpage
    168
  • Abstract
    An extensive characterization of the influence of series resistance on programming of 1.0¿m technology EPROM cells is presented. The different effects of series resistances on the source or on the drain have been pointed out. Furthermore a simple analytical model has been developed to simulate the influences on the programming.
  • Keywords
    Analytical models; Capacitance measurement; Current measurement; EPROM; Electrical resistance measurement; Functional programming; Length measurement; Threshold voltage; Time measurement; Velocity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1990. ESSDERC '90. 20th European
  • Conference_Location
    Nottingham, England
  • Print_ISBN
    0750300655
  • Type

    conf

  • Filename
    5436420
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1933961