DocumentCode :
1934261
Title :
Optimization of P Implanted Silicon Bolometers
Author :
Baciocco, E. ; Boragno, C. ; Valbusa, U. ; Bresolin, C. ; Pignatel, G.
Author_Institution :
Dipartimento di Fisica, Via Dodecaneso 33, 16146 Genova, Italy
fYear :
1987
fDate :
14-17 Sept. 1987
Firstpage :
245
Lastpage :
248
Abstract :
We have measured electrical resistance R as function of temperature T in the range 2 % 20 K of severaL P implanted Silicon bolonmeters with the aim of optimize the characteristics of the bolometers. We have investigated the R(T) behavior of several samples obtaitned by varying implant conditions, depth profile and annealing.
Keywords :
Bolometers; Electric resistance; Electric variables measurement; Electrical resistance measurement; Extraterrestrial measurements; Physics; Silicon; Temperature dependence; Temperature distribution; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
Conference_Location :
Bologna, Italy
Print_ISBN :
0444704779
Type :
conf
Filename :
5436433
Link To Document :
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