DocumentCode :
1934677
Title :
High-resolution spectroscopy as an X-ray laser plasma diagnostic
Author :
Koch, J.A. ; Batson, P.J. ; Da Silva, L.B. ; MacGowan, B.J. ; Matthews, D.L. ; Mrowka, S. ; Nilsen, J. ; Underwood, J.H.
Author_Institution :
Lawrence Livermore Nat. Lab., Livermore, CA, USA
fYear :
1993
fDate :
7-9 June 1993
Firstpage :
146
Abstract :
Summary form only given, as follows. A number of experiments have been performed using a high-resolution XUV (extreme ultraviolet) spectrometer to measure the spectral widths of X-ray laser lines from several elements. These experiments used yttrium, selenium, niobium, and zirconium targets, and included an investigation of the effects of gain and saturation on X-ray laser line widths and the measurement of hyperfine splitting effects on X-ray laser line shapes. The relevance of the data obtained to the understanding of the physics of X-ray laser plasmas and high-temperature laser-produced plasmas in general has been examined.
Keywords :
X-ray lasers; Nb; Se; X-ray laser lines; X-ray laser plasma diagnostic; XUV spectroscopy; Y; Zr; gain; high-resolution spectroscopy; high-temperature laser-produced plasmas; hyperfine splitting effects; laser line shapes; saturation; spectral widths; Laser theory; Performance evaluation; Plasma diagnostics; Plasma measurements; Plasma x-ray sources; Shape measurement; Spectroscopy; Ultraviolet sources; X-ray lasers; Yttrium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1993. IEEE Conference Record - Abstracts., 1993 IEEE International Conference on
Conference_Location :
Vancouver, BC, Canada
ISSN :
0730-9244
Print_ISBN :
0-7803-1360-7
Type :
conf
DOI :
10.1109/PLASMA.1993.593419
Filename :
593419
Link To Document :
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