DocumentCode :
1934694
Title :
Dense plasma diagnostics by means of X-ray scattering
Author :
Nardi, E. ; Riley, Daniel
Author_Institution :
Dept. of Phys., Wiezmann Inst. of Sci., Rehovot, Israel
fYear :
1993
fDate :
7-9 June 1993
Firstpage :
146
Abstract :
Summary form only given. A new method for diagnosing hot dense partially ionized plasmas by means of X-ray scattering is proposed. The very distinct angular distribution of the scattered X-rays calculated on the basis of the separate contributions of the bound and free electrons gives detailed information on the plasma. Results are presented for aluminium plasmas at a temperature of 20 eV at densities ranging from 0.01 to 10 g/cm/sup 3/. The cross section for the scattering of 7.47 keV X-rays (Ni K alpha) as a function of angle shows a very distinct dependence on the plasma density as do results at a constant density of 0.1 g/cm/sup 3/ with temperatures between 10 and 50 eV. X-ray scattering from carbon plasmas at a density of 0.001 g/cm/sup 3/ for temperatures ranging from 2 to 40 eV was also calculated. Such plasmas are being produced in high-intensity Li beam interactions with plasma targets in connection with inertial-confinement-fusion studies.
Keywords :
plasma diagnostics; 10 to 50 eV; 2 to 40 eV; 20 eV; 7.47 keV; Al; C; Li beam interactions; Ni K alpha; X-ray scattering; angular distribution; bound electrons; free electrons; hot dense partially ionized plasmas; inertial-confinement-fusion; plasma density; plasma targets; scattered X-rays; Aluminum; Electrons; Particle beams; Plasma density; Plasma diagnostics; Plasma temperature; Plasma x-ray sources; Temperature dependence; Temperature distribution; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1993. IEEE Conference Record - Abstracts., 1993 IEEE International Conference on
Conference_Location :
Vancouver, BC, Canada
ISSN :
0730-9244
Print_ISBN :
0-7803-1360-7
Type :
conf
DOI :
10.1109/PLASMA.1993.593420
Filename :
593420
Link To Document :
بازگشت