DocumentCode :
1934836
Title :
Dual-stage microinverter design with a GaN-based interleaved flyback converter stage
Author :
Garcia-Rodriguez, L. ; Williams, Evan ; Balda, Juan Carlos ; Gonzalez-Llorente, J. ; Lindstrom, E. ; Oliva, Alfonso
Author_Institution :
Dept. of Electr. Eng., Univ. of Arkansas, Fayetteville, AR, USA
fYear :
2013
fDate :
15-19 Sept. 2013
Firstpage :
4496
Lastpage :
4502
Abstract :
Photovoltaic (PV) systems must maximize the energy harvested from the PV panel. One method is the use of microinverters that are less susceptible to shade effects when compared to string or central inverters. Efficiency is always an important specification, particularly, when compared to that of a central inverter. The main losses of a microinverter are transformer and semiconductor losses. Power switching devices based on silicon (Si) material are traditionally used, and silicon carbide (SiC) Schottky diodes are replacing Si diodes due to their low reverse recovery energy. Recently, Gallium Nitride (GaN) power switching devices, capable of switching at higher frequencies with fewer losses when compared to Si or SiC devices, have been introduced. Higher frequencies enable designs with smaller capacitive and inductive elements. This in turn reduces system size and cost. This work analyzes a dual-stage microinverter with an interleaved flyback converter in the dc-dc stage and GaN devices for the low-voltage side. Experimental results from a 40W prototype confirm the benefits of the proposed system.
Keywords :
DC-DC power convertors; III-V semiconductors; gallium compounds; invertors; power semiconductor switches; wide band gap semiconductors; DC-DC converter; GaN; PV panel; PV system; capacitive elements; dual-stage microinverter design; energy harvesting; inductive elements; interleaved flyback converter stage; low reverse recovery energy; photovoltaic systems; power 40 W; power switching devices; semiconductor losses; silicon carbide Schottky diodes; silicon material; transformer losses; Capacitance; Gallium nitride; Logic gates; Silicon; Silicon carbide; Switching frequency; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2013 IEEE
Conference_Location :
Denver, CO
Type :
conf
DOI :
10.1109/ECCE.2013.6647302
Filename :
6647302
Link To Document :
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