• DocumentCode
    1935031
  • Title

    A Novel Substrate Hot Electron and Hole Injection Structure with a Double Implanted Buried Channel Mosfet

  • Author

    Sukvoon Yoon ; Siergiej, R. ; White, M.H.

  • Author_Institution
    Lehigh University, Bethlehem, PA
  • fYear
    1991
  • fDate
    17-19 June 1991
  • Keywords
    Charge carrier processes; Degradation; Drain avalanche hot carrier injection; Electron traps; Hot carriers; Implants; Insulation; Space charge; Substrate hot electron injection; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 1991. 49th Annual
  • Conference_Location
    Boulder, CO, USA
  • Print_ISBN
    0-87942-647-0
  • Type

    conf

  • DOI
    10.1109/DRC.1991.664731
  • Filename
    664731
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1935031