Traceable microwave and MM wave EIRP measurements

Summary form only given. Several developments lead to an increased need for traceable measurements of power and EIRP in the mm-wave bands. There is an increasing number of commercial applications that use the V and W band for their operation frequency, such as automotive RADARS or microwave image systems. At the same time more and more international standards such as EN require the measurement of spurious to 110 GHz and beyond. For certification for both use cases test houses and manufacturers need to perform measurements that are traceable to national standards laboratories such as the German PTB (Physikalisch-Technische Bundesanstalt) or NIST. Basic requirements and measurement limits for EIRP measurements are discussed including the use of harmonic mixers as frequency extension. Traceable calibration of the conversion loss of such mixers is shown and achievable uncertainties discussed. Finally a measurement example for EIRP of a microwave imaging system operating between 70 and 80 GHz is shown, proving that its emission is within safe limits.