DocumentCode
1935215
Title
Modeling and representation of manufacturing process with uncertainties using parametric modular design and xPNML
Author
Lee, Hyunsoo ; Banerjee, Amarnath
Author_Institution
Dept. of Ind. & Syst. Eng., Texas A&M Univ., TX
fYear
2009
fDate
18-22 May 2009
Firstpage
512
Lastpage
519
Abstract
This paper proposes fuzzy colored Petri nets with stochastic time delay (FCPN-std) as one of methodologies of incorporating qualitative uncertainties and stochastic information in a manufacturing system. As a combined model with fuzzy colored Petri Nets (FCPNs) and stochastic Petri nets (SPNs), it captures and models statistical and qualitative uncertainties in manufacturing processes. A parametric modular design methodology is proposed for effective design of complex processes. A mold producing process in digital camera making industry is modeled as an example application. The model incorporating uncertain and stochastic information is represented using extended Petri net markup language (xPNML) architecture. xPNML formatted fuzzy colored Petri net with stochastic time delay is shown as an effective design methodology and representation tool for describing manufacturing processes and capturing uncertainties.
Keywords
Petri nets; XML; delays; fuzzy set theory; graph colouring; manufacturing processes; manufacturing systems; statistical analysis; stochastic processes; FCPN-std; complex process; extended Petri net markup language; fuzzy colored Petri net-stochastic time delay; manufacturing process; manufacturing system; parametric modular design; statistical uncertainty; xPNML; Delay effects; Design methodology; Fuzzy systems; Manufacturing processes; Manufacturing systems; Petri nets; Process design; Stochastic processes; Stochastic systems; Uncertainty; Fuzzy Colored Petri Net with Stochastic Time Delay; Parametric Modular Design; Qualitative and Statistical Uncertainty; xPNML;
fLanguage
English
Publisher
ieee
Conference_Titel
Collaborative Technologies and Systems, 2009. CTS '09. International Symposium on
Conference_Location
Baltimore, MD
Print_ISBN
978-1-4244-4584-4
Electronic_ISBN
978-1-4244-4586-8
Type
conf
DOI
10.1109/CTS.2009.5067521
Filename
5067521
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