DocumentCode
1935424
Title
Testability of digital circuits via the spectral domain
Author
Bannister, Brian R. ; Melton, David R. ; Taylor, Gaynor E.
Author_Institution
Hull Univ., UK
fYear
1989
fDate
2-4 Oct 1989
Firstpage
340
Lastpage
343
Abstract
The authors demonstrate how the spectral testability of digital circuits can be evaluated in the spectral domain using two standard testability measures: controllability and observability. It is shown how these measures are obtained. Software considerations are discussed, and the evaluation of the testability of an SN74181 arithmetic logic chip is given as an example
Keywords
digital integrated circuits; integrated circuit testing; logic testing; SN74181; arithmetic logic chip; controllability; observability; spectral domain; spectral testability; standard testability measures; testability evaluation; testability of digital circuits; Boolean functions; Circuit testing; Controllability; Costs; Digital circuits; Input variables; Integrated circuit testing; Observability; Probability; Production;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design: VLSI in Computers and Processors, 1989. ICCD '89. Proceedings., 1989 IEEE International Conference on
Conference_Location
Cambridge, MA
Print_ISBN
0-8186-1971-6
Type
conf
DOI
10.1109/ICCD.1989.63383
Filename
63383
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