Title :
Testability of digital circuits via the spectral domain
Author :
Bannister, Brian R. ; Melton, David R. ; Taylor, Gaynor E.
Author_Institution :
Hull Univ., UK
Abstract :
The authors demonstrate how the spectral testability of digital circuits can be evaluated in the spectral domain using two standard testability measures: controllability and observability. It is shown how these measures are obtained. Software considerations are discussed, and the evaluation of the testability of an SN74181 arithmetic logic chip is given as an example
Keywords :
digital integrated circuits; integrated circuit testing; logic testing; SN74181; arithmetic logic chip; controllability; observability; spectral domain; spectral testability; standard testability measures; testability evaluation; testability of digital circuits; Boolean functions; Circuit testing; Controllability; Costs; Digital circuits; Input variables; Integrated circuit testing; Observability; Probability; Production;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1989. ICCD '89. Proceedings., 1989 IEEE International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-1971-6
DOI :
10.1109/ICCD.1989.63383
