• DocumentCode
    19356
  • Title

    Robust SAR Image Registration Based on Edge Matching and Refined Coherent Point Drift

  • Author

    Han Zhang ; Weiping Ni ; Weidong Yan ; Junzheng Wu ; Sha Li

  • Author_Institution
    Northwest Inst. of Nucl. Technol., Xi´an, China
  • Volume
    12
  • Issue
    10
  • fYear
    2015
  • fDate
    Oct. 2015
  • Firstpage
    2115
  • Lastpage
    2119
  • Abstract
    This letter presents an effective approach for synthetic aperture radar (SAR) image registration. Corresponding edge features are extracted by exploring the local spatial relationship around corresponding speeded-up robust feature points. Only edge pairs that are matched in the aspect of distance and orientation to the center feature points are taken as effective edge features. For edge-point set matching, we introduce the coherent point drift (CPD) registration method. CPD is able to maintain the global topological structure of edges and is robust to outliers. We refine the original CPD by taking our confidence on edge points as prior information. A new objective function is deduced, resulting in a better registration performance. Experimental results show that the proposed method performs well in terms of registration robustness and accuracy.
  • Keywords
    edge detection; feature extraction; image registration; remote sensing by radar; synthetic aperture radar; SAR image registration; coherent point drift registration method; edge feature extraction; edge global topological structure; edge-point set matching; image registration performance; refined coherent point drift; speeded-up robust feature point; synthetic aperture radar image registration; Accuracy; Feature extraction; Image edge detection; Image registration; Robustness; Synthetic aperture radar; Transforms; Coherent point drift (CPD); edge matching; speeded-up robust feature (SURF); synthetic aperture radar (SAR) image registration;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2015.2451396
  • Filename
    7163303