Title :
Modelling and Simulation of Wave Propagation Effects in MESFET Devices based on Physical Models
Author :
Ghione, Giovanni ; Naldi, Carlo U.
Author_Institution :
Dipartimento di Elettronica, Politeenico di Torino, Corso Duca degli Abruzzi 24, 10129 TORINO, Italy
Abstract :
Propagation effects along the electrodes of single- and multi-gate MESFETs are analyzed by means of new model which directly exploits two-dimensional small-signal simulation. The electromagnetic behaviour is characterized through a quasi-TEM multiconductor line model, and preliminary results are presented concerning the influence of gate width on the overall device performances.
Keywords :
Analytical models; Electrodes; Electromagnetic coupling; Electromagnetic devices; Electromagnetic modeling; Electromagnetic propagation; MESFETs; Microwave propagation; Power transmission lines; Propagation losses;
Conference_Titel :
Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
Conference_Location :
Bologna, Italy
