Electronic nose for the identification of spoiled Iberian hams

Author

García, M. ; Aleixandre, M. ; Horrillo, M.C.

Author_Institution

Lab. de Sensores, IFA-CSIC, Madrid, Spain

fYear

2005

fDate

2-4 Feb. 2005

Firstpage

537

Lastpage

540

Abstract

This paper reports the use of an electronic nose for the identification of spoiled hams during the curing process. The sensors involved are tin oxide semiconductor thin films. They were prepared by RF sputtering. Some of the sensors were doped with metal catalysts as Cr and In. A good discrimination of two types of Iberian hams (spoiled and unspoilt) has been obtained through the statistical methods of principal component analysis (PCA) and probabilistic neural network (PNN).

Keywords

chemical sensors; chromium; electronic noses; indium; neural nets; principal component analysis; semiconductor doping; sputtering; tin compounds; Cr; In; RF sputtering; SnO/sub 2/; curing process; electronic nose; metal catalysts; principal component analysis; probabilistic neural network; sensors; spoiled Iberian hams; tin oxide semiconductor thin films; Chromium; Curing; Electronic noses; Principal component analysis; Radio frequency; Radiofrequency identification; Semiconductor thin films; Sputtering; Thin film sensors; Tin;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices, 2005 Spanish Conference on

Conference_Location

Tarragona

Print_ISBN

0-7803-8810-0

Type

conf

DOI

10.1109/SCED.2005.1504508

Filename

1504508

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1935763