• DocumentCode
    1935936
  • Title

    A Fast Boundary Tracing Scheme Using Image Patch Classification

  • Author

    Shen, Weijia ; Kassim, Ashraf A. ; Shih-Chang, Wang

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore
  • Volume
    1
  • fYear
    2008
  • fDate
    27-30 May 2008
  • Firstpage
    787
  • Lastpage
    791
  • Abstract
    This paper proposes a novel fast boundary tracing scheme which naturally encodes the prior knowledge. Another advantage is that this scheme is independent of the subsequent segmentation process. Therefore, it can serve as a pre-processing step in any segmentation scheme. For example, it could be used to automatically generate a close- to-boundary initialization for all types of deformable models. Topographic Independent Component Analysis (TICA) based feature exaction technique is adopted for learning a representation from a set of image patches in an unsupervised way. During learning, a topographic map of basis components emerge. A unique intelligent contour generation procedure is also proposed. Experimental results on abdominal CT images demonstrate the potential of our approach.
  • Keywords
    computerised tomography; image classification; image representation; image segmentation; independent component analysis; medical image processing; abdominal CT images; automatic boundary tracing; computer aided diagnosis; computerised tomography; fast boundary tracing scheme; feature exaction technique; image patch classification; intelligent contour generation procedure; segmentation scheme; topographic independent component analysis; topographic map; Abdomen; Biomedical engineering; Biomedical imaging; Computed tomography; Deformable models; Gabor filters; Image segmentation; Independent component analysis; Medical diagnostic imaging; Principal component analysis; Boundary tracing; automatic initialization; deformable model; patch classification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    BioMedical Engineering and Informatics, 2008. BMEI 2008. International Conference on
  • Conference_Location
    Sanya
  • Print_ISBN
    978-0-7695-3118-2
  • Type

    conf

  • DOI
    10.1109/BMEI.2008.228
  • Filename
    4548778