DocumentCode
1936366
Title
Invited Speech: BigData application for 28nm and below
Author
Yu, Min-Chieh
fYear
2012
fDate
4-4 Sept. 2012
Firstpage
1
Lastpage
1
Abstract
BigData application has been explored in semiconductor industry. However, there are very few success stories so far. In this presentation, we will highlight the main challenges for BigData application for 28nm below, from data collection, analysis software and algorithm, and ROI point of view. We will then describe our concept of YieldAware - BigRealData (YA-Bird) concept. Finally, we will show some examples of BigData application for parametric yield improvement for 28nm and below.
Keywords
data analysis; production engineering computing; production management; semiconductor industry; BigData application; ROI point-of-view; YieldAware-BigRealData concept; analysis software; data collection; parametric yield improvement; return-on-investment; semiconductor industry; size 28 nm; Abstracts; Collaboration; Companies; Educational institutions; Europe; Speech;
fLanguage
English
Publisher
ieee
Conference_Titel
e-Manufacturing & Design Collaboration Symposium (eMDC), 2012
Conference_Location
HsinChu
Print_ISBN
978-1-4673-4540-8
Type
conf
DOI
10.1109/eMDC.2012.6338431
Filename
6338431
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