Title :
Vertical integration of spin dependent tunnel junction and amorphous Si diode for MRAM application
Author :
Sousa, R.C. ; Freitas, P.P. ; Chu, V. ; Conde, J.P.
Author_Institution :
INESC
Keywords :
Amorphous magnetic materials; Amorphous materials; Artificial intelligence; Current measurement; Electrical resistance measurement; Magnetic field measurement; Magnetic materials; Schottky diodes; Semiconductor diodes; Sun;
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
DOI :
10.1109/INTMAG.1999.837968