DocumentCode :
1936994
Title :
Measuring radiation of small electronic equipment in three-dimensional TEM cells
Author :
Klingler, M. ; Deniau, V. ; Egot, S. ; Demoulin, B. ; Sarkar, T.
Author_Institution :
INRETS-LEOST, Villeneuve d´´Ascq, France
fYear :
2001
fDate :
2001
Firstpage :
21
Lastpage :
24
Abstract :
Three-dimensional TEM cells are starting to be used for EMC immunity testing and radiation measurements. In the second case, these new test facilities offer the advantage of not having to place the equipment under test in different positions to obtain its total radiated power or its far-field radiation pattern. After a brief overview of the general concept of 3D-TEM cells followed by a summary on radiation measurements in TEM and GTEM cells, the second part of this paper presents the practical application of radiation measurements of off-the-shelf electronic equipment using an industrial prototype of a 6-plate 3D-TEM cell. The results are then compared to reference results obtained of a conventional symmetrical TEM cell. This paper concludes with the repeatability and reproducibility of results obtained and the possibilities of measuring radiation from very small items such as electronic components
Keywords :
electromagnetic compatibility; electromagnetic wave polarisation; electronic equipment testing; power measurement; test facilities; EMC immunity testing; GTEM cells; far-field radiation pattern; off-the-shelf electronic equipment; radiation measurements; repeatability; reproducibility; small electronic equipment; test facilities; three-dimensional TEM cells; total radiated power; Connectors; Couplings; Electromagnetic measurements; Electronic equipment; Frequency; Immunity testing; Open area test sites; Prototypes; TEM cells; Test facilities;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging, 2001
Conference_Location :
Cambridge, MA
Print_ISBN :
0-7803-7024-4
Type :
conf
DOI :
10.1109/EPEP.2001.967602
Filename :
967602
Link To Document :
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