Title :
Bound states in a temporal fiber network with parity-time symmetry
Author :
Regensburger, Alois ; Miri, Mohammad-Ali ; Bersch, Christoph ; Nager, Jakob ; Onishchukov, G. ; Christodoulides, Demetrios N. ; Peschel, Ulf
Author_Institution :
Inst. of Opt., Inf. & Photonics, Univ. of Erlangen-Nurnberg, Erlangen, Germany
Abstract :
Summary form only given. We report on the first experimental investigation of light propagation around defects in parity-time (PT) symmetric photonic lattices. An extended PT mesh lattice is realized using a setup consisting of two coupled fiber loops with different lengths and time dependent modulation of net gain/loss. Time-multiplexing is applied to map a 1D grid of transverse positions into the temporal domain thus transferring concepts of PT symmetric systems to pulse propagation. To guide bound light modes through this mesh lattice, we introduce a phase defect φd which occupies a single site in the periodic lattice.
Keywords :
eigenvalues and eigenfunctions; light propagation; optical fibre losses; optical fibre networks; optical lattices; optical modulation; parity; photonic band gap; time division multiplexing; 1D grid; Hamiltonian systems; PT symmetric system; band gaps; bound light modes; bound mode; bound states; coupled fiber loops; discrete lattice band gap; exponentially localized defect modes; extended PT mesh lattice; light propagation; mode beating; net gain/loss; parity-time symmetric photonic lattices; parity-time symmetry; passive mesh lattice; periodic lattice; periodic modulation; propagation constant; pulse propagation; real eigenvalues; second localized mode; single site; small defect phase shift; strong phase defects; temporal domain; temporal fiber network; time dependent modulation; time-multiplexing; total energy; transverse positions; Educational institutions; Lattices; Optical fiber networks; Optical pulses; Photonics; Propagation losses;
Conference_Titel :
Lasers and Electro-Optics Europe (CLEO EUROPE/IQEC), 2013 Conference on and International Quantum Electronics Conference
Conference_Location :
Munich
Print_ISBN :
978-1-4799-0593-5
DOI :
10.1109/CLEOE-IQEC.2013.6801814
